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KMID : 1151820100040040005
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Journal of the Korean Society of Radiology
2010 Volume.4 No. 4 p.5 ~ p.10
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A Study on the Fabrication and Physical Properties of Ca2SiO4 :La Thermoluminescent Phosphors
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Kim Choung-Mi
Seo Mi-Kyong
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Abstract
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The Ca₂SiO₄ phosphors doped by La with 0.1 wt%, 0.3 wt%, 0.5 wt%, and 1.0 wt% concentration were prepared by sintering at 1000℃ for 90 minutes in N2 atmosphere. The phosphors were ground in powdered form and were grouped in 100 ㎛ size, then the samples had been exposed to low energy X-ray and UV light. The TL glow curves were measured by heating the phosphors at 10℃/s rate. There was no significantly meaningful correlation between the TL intensity and the doping level. The intensities of the TL peak measured from X-ray irradiated samples doped with 0.1 wt% were relatively strong. The activation energy and the frequency factor were 0.434 ~ 0.516 eV and 0.5 ~ 0.56, respectively. The intensities of the TL peak measured from UV irradiated samples doped with 0.3 wt% were relatively strong. The activation energy and frequency factor were 0.415 ~ 0.477 eV and 0.5 ~ 0.53, respectively. The TL process were found to be the 2nd order for both X-ray and UV irradiation. The TL intensity was increased linearly with the increase of the radiation dose. In summary, the Ca₂SiO₄ phosphors developed in this study showed good TL characteristics at low energy X-ray and UV light. We believe they will be used as TLDs in near future for personal and environmental radiation detection dosimetry.
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KEYWORD
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